Motic Panthera TEC-POL Polarizing Microscopes – Advanced LED/Halogen Polarization System for Material & Geological Analysis
Motic Panthera TEC-POL Polarizing Microscopes – Advanced LED/Halogen Polarization System for Material & Geological Analysis
- Dual Light Illumination System (LED & Halogen): Interchangeable transmitted and incident Köhler illumination ensures optimal brightness for both transparent and opaque samples.
- UC Plan Strain-Free Objectives: High-quality 4X, 10X, 40X(S), and 60X(S) lenses deliver distortion-free, high-contrast imaging of birefringent and reflective materials.
- Integrated Bertrand Lens: Centerable and focusable design enables accurate analysis of crystal interference figures and optical axes.
- Trinocular Viewing Head with 50/50 Light Split: Siedentopf-type 25° inclined head allows simultaneous viewing and digital imaging for real-time analysis and documentation.
- Precision Polarization System: Features rotatable analyzer and polarizer for detailed birefringence studies under brightfield and polarized light modes.
- Motic LightTracer System: Coded nosepiece and digital light control ensure repeatable illumination settings for consistent imaging across research sessions.
The Motic Panthera TEC-POL Series delivers research-grade performance for polarized light microscopy, designed for material science, geology, crystallography, and industrial inspection. Built on Motic’s precision-engineered UC Plan strain-free optical system, these microscopes offer unmatched clarity, color fidelity, and mechanical stability for transmitted and reflected light applications.
The Binocular configuration provides professional-grade optical performance for birefringent and reflective specimens—ideal for analyzing minerals, metals, foils, fibers, and crystals. Featuring Full Köhler illumination with interchangeable LED and halogen light sources, it ensures bright, even lighting for accurate polarization results.
The Trinocular configuration adds digital imaging flexibility, featuring a Siedentopf head (25° inclined, 50/50 light split) with a camera port for real-time documentation and image analysis. The integrated Bertrand lens, rotatable analyzer, and coded nosepiece enable advanced crystal and interference studies with precision and repeatability.
With ergonomic design, Motic LightTracer intelligent illumination control, and durable construction, the Panthera TEC-POL Series stands as the ideal solution for university research, industrial quality control, and geological laboratories demanding accuracy, reliability, and comfort in every analysis.
