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Empowering the Future of Science Education

The Motic Panthera TEC Series sets a new standard in industrial and materials science microscopy, combining optical precision with modular illumination flexibility. Designed for quality control, surface inspection, semiconductor evaluation, and material analysis, these microscopes deliver superior clarity, depth, and contrast across a range of reflective and transparent samples.

Powered by Motic’s CCIS® Infinity Optical System, each model ensures sharp, distortion-free imaging with LD Plan and S-Apochromatic BD objectives for maximum color fidelity and edge definition.

The TEC-BF/RL model supports Brightfield + Reflected Light for polished and metallic surfaces.

The TEC-BF/RL/TL adds Transmitted Light, ideal for transparent or layered materials.

The TEC-BD/DF/RL expands to Darkfield and Brightfield for micro-defect and coating inspections.

The flagship TEC-BD/DF/RL/TL integrates all four illumination modes, offering unmatched versatility for research and industrial applications.

With precision 6×4 mechanical stages, segmental reflected illumination, and dual LED/Köhler systems, the Panthera TEC Series delivers professional-grade performance for modern laboratories, R&D centers, and production environments.